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TSAI LEE & CHEN congratulation

 

Congratulations to our colleagues who succeeded in the 2019 (P.R.) China National Bar and Patent Bar Examination.

China National Bar: Mr. Vincent W.Y. Lin
 
China Patent Bar: Mr. Felix C.T. Chiang, Mr. Archer Y.C. Chang, Ms. Tzu-Ning Liu, Mr. Eric Z. X. Lou, Mr. Gary Y. T. Chen, Ms. Lily L. Y. Chen, Mr. Brian P. T. Li, Ms. Pei-Yu Hung.

 

 

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