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TSAI LEE & CHEN congratulation

 

 





Our patent engineers succeeded in the 2017 (P.R.) China Patent Bar Examination.

Mr. James H.C. Su 
Mr. Wen-Yu Lin 
Mr. Ching-Ya Hsu 
Mr. Yen-Cheng Chen
Ms. Frances H.Y. Kao
Ms. Yu-Chun Chou
Ms. Serina S.Y. Han
Ms. Anlin Li 
 

 
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